Cleaved MgO(100) single crystals were implanted with 30 keV He-3 ions with
doses varying from 1 x 10(19) to 1 x 10(20) m(-2) and subsequently thermall
y annealed from 100 to 1100 degrees C. Transmission electron microscopy obs
ervations revealed the existence of sharply rectangular nanosize voids at a
depth slightly shallower than the helium-implantation range. Monitoring of
the defect depth profile and the retained amount of helium was performed b
y positron-beam analysis and neutron depth profiling, respectively. (C) 200
0 American Institute of Physics. [S0003-6951(00)01709-5].