An electrode contact scheme based on the use of an organic LiF alloy is inv
estigated. The performance of organic light emitting diodes (OLED) with thi
s contact scheme in both heterojunction and bipolar transport/emitting laye
r (BTEL) OLED structures are compared with their counterparts with LiF buff
er layers. The organic LiF contact scheme improved device reliability of BT
EL OLEDs by 32% to 92 500 h while adversely affecting device reliability of
heterojunction OLEDs. (C) 2000 American Institute of Physics. [S0003-6951(
00)02508-0].