An analysis of temperature dependent piezoelectric Franz-Keldysh effect inAlGaN

Citation
Yt. Hou et al., An analysis of temperature dependent piezoelectric Franz-Keldysh effect inAlGaN, APPL PHYS L, 76(8), 2000, pp. 1033-1035
Citations number
30
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
8
Year of publication
2000
Pages
1033 - 1035
Database
ISI
SICI code
0003-6951(20000221)76:8<1033:AAOTDP>2.0.ZU;2-Y
Abstract
Strong Franz-Keldysh oscillations near the band gap of AlGaN are observed i n the contactless electroreflectance (CER) studies of a GaN/InGaN/AlGaN mul tilayer structure. The line shape analysis of the CER spectra at different temperatures provides an accurate determination of the AlGaN band gap energ ies and the built-in electric fields. Using the existing data of the therma l expansion coefficients of GaN and sapphire, and the piezoelectric constan ts of AlGaN, the temperature dependence of the electric field is estimated and is in good agreement with the experimental results between 15 and 300 K . We attribute such electric field to the piezoelectric strain effect. (C) 2000 American Institute of Physics. [S0003-6951(00)02308-1].