SnO2 and SnS2 thin films have been prepared by the spray pyrolysis techniqu
e for photovoltaic application purposes and characterized by high-frequency
acoustic microscopy (570 MHz). The surface acoustic images reveal contrast
s explained by differences in topography according to atomic force microsco
py studies. The acoustic signature V(z) of the systems layer/substrate were
modelled and refined to fit with the experimental V(z). The acoustic param
eters of the layers were calculated using the results of the final simulati
on. The values of Young's modulus deduced from the acoustic parameters, 401
and 56 GPa for SnO2 and SnS2, respectively, are discussed in relation with
the chemical structure and bonding involved.