Surface shape resonances of ridges on a thin film

Citation
Jm. Pereira et al., Surface shape resonances of ridges on a thin film, EUR PHY J B, 13(3), 2000, pp. 589-593
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
EUROPEAN PHYSICAL JOURNAL B
ISSN journal
14346028 → ACNP
Volume
13
Issue
3
Year of publication
2000
Pages
589 - 593
Database
ISI
SICI code
1434-6028(200002)13:3<589:SSRORO>2.0.ZU;2-A
Abstract
The spectrum of surface shape resonances associated with a finite number of ridges on one interface of an otherwise plane film is calculated. The freq uencies are obtained numerically by solving the homogeneous integral equati ons which describe the electrostatic field in the vicinity of a surface def ect. The calculations are performed for a surface with ridges with Gaussian , Lorentzian and sinusoidal profiles. The results show a strong dependence of the localized plasmon frequencies on the surface profile; on the distanc e between the ridges, and on the thickness of the film.