A continuously working sampling and analyzing device was developed and test
ed. It is suitable for monitoring of metals bound to particulate matter in
emissions of stack gases. The samples were precipitated on a pure quartz fi
ber filter tape and analyzed shortly afterwards non-destructively by an ene
rgy dispersive X-ray spectrometer (EDXRS). By using this method a wide rang
e of elements with atomic numbers from 19 (K) to 82 (Pb) can be analyzed. N
ew experiments have shown that the novel combined particle sampling and ana
lysis system (X-DUST) could also successfully be used for the monitoring of
toxic elements in ambient air.