Low-threshold InGaAsP ring lasers fabricated using bi-level dry etching

Citation
G. Griffel et al., Low-threshold InGaAsP ring lasers fabricated using bi-level dry etching, IEEE PHOTON, 12(2), 2000, pp. 146-148
Citations number
12
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
IEEE PHOTONICS TECHNOLOGY LETTERS
ISSN journal
10411135 → ACNP
Volume
12
Issue
2
Year of publication
2000
Pages
146 - 148
Database
ISI
SICI code
1041-1135(200002)12:2<146:LIRLFU>2.0.ZU;2-V
Abstract
We report a novel bi-level etching technique that permits the use of standa rd photolithography for coupling to deeply etched ring resonator structures . The technique is employed to demonstrate InGaAsP laterally coupled racetr ack ring resonators laser with record low threshold currents of 66 mA. The racetrack laser have curved sections of 150-mu m radius with negligible ben ding loss. The lasers operate continuous-wave single mode up to nearly twic e threshold with a 26-dB side-mode-suppression ratio. Bi-level etching is o f interest for fabrication of mesoscopic or microcavity photonic resonator structures without relying on submicrometer processing.