Characterization and simulation of GaSb device-related properties

Citation
G. Stollwerck et al., Characterization and simulation of GaSb device-related properties, IEEE DEVICE, 47(2), 2000, pp. 448-457
Citations number
41
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON ELECTRON DEVICES
ISSN journal
00189383 → ACNP
Volume
47
Issue
2
Year of publication
2000
Pages
448 - 457
Database
ISI
SICI code
0018-9383(200002)47:2<448:CASOGD>2.0.ZU;2-T
Abstract
Device related parameters of GaSb are characterized and simulated based on measurements of photovoltaic cells. Internal quantum efficiencies are simul ated to quantify the contributions from band-gap narrowing and the main rec ombination mechanisms, such as Auger, radiative, and Shockley-Read-Hall rec ombination, A detailed study of the recombination mechanisms values shows d ifferences between literature data and data derived from comparison of simu lation results with measurements on real devices. A new evaluation of these data is given. The evaluation of the band-gap narrowing in n-GaSb is perfo rmed by comparison of measurements and simulations of the injection compone nt of the dark current l(01) and open-circuit voltage. Far the first time, a range of possible values for the intrinsic carrier concentration of GaSb at room temperature is given, based on theoretical calculations, and proven with comparison of measured I-01 and open-circuit voltages of GaSb photovo ltaic devices.