K. Yang et al., Electrooptic mapping and finite-element modeling of the near-field patternof a microstrip patch antenna, IEEE MICR T, 48(2), 2000, pp. 288-294
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
A comprehensive electrooptic field-mapping technique is applied to the char
acterization of near-field radiation patterns above a microstrip patch ante
nna. The amplitude and phase maps of three orthogonal electric-field compon
ents, measured using electrooptic crystals above the patch, also have revea
led the transition from the near field to the far field of the radiation pa
ttern, In addition, experimental results have been compared with a finite-e
lement method (FEM) simulation, The measurements show superior results to t
he FEM simulation, especially in terms of spatial resolution and data acqui
sition times. Furthermore, the scattering parameter S-11 for the patch ante
nna has been calculated from the electrooptic measurement results of standi
ng waves on the feeding line and compared with results from a conventional
network analyzer.