Impedance spectroscopy behavior of cross-linked polyethylene

Impedance spectroscopy (IS) was to analyze the dielectric behavior of cross -linked polyethylene (XLPE) and to produce an electric analog equivalent ci rcuit. In the high-frequency range, a peak was observed, and the values of the resistance for this particular frequency were calculated for the XLPE s amples with different thicknesses. Two ohmic regions with different slopes were observed, suggesting the existence of two regions in the crystalline p hase with the same morphological characteristics, but different sizes (i.e. , similar time constants). A reduced two-phase model was used to explain th e observed behavior of samples with different thicknesses. It is suggested that thinner samples present a crystalline layer with lamellae perpendicula r to the surface, whereas in thicker samples, a bulk spherulitic morphology is dominant.