Soft-x-ray resonant magnetic diffuse scattering from strongly coupled Cu/Co multilayers

By separately identifying magnetic and charge scatter, we find conclusive e vidence for conformality in magnetic roughness in {Co (8 Angstrom) Cu (9 An gstrom)} multilayers. For layers magnetized in the easy direction, the magn etic roughness equals the structural roughness but increases when magnetize d in the hard direction. The in-plane magnetic correlation length, which ch anges on magnetization is several orders of magnitude larger than the struc tural roughness length scales. The magnetic length scale is bf the same ord er as;magnetic ripple observed in Lorentz microscopy and is not associated with domains.