Pushing the Auger limit: Kinetics of excitons in traps in Cu2O

Citation
Dw. Snoke et V. Negoita, Pushing the Auger limit: Kinetics of excitons in traps in Cu2O, PHYS REV B, 61(4), 2000, pp. 2904-2910
Citations number
34
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
10980121 → ACNP
Volume
61
Issue
4
Year of publication
2000
Pages
2904 - 2910
Database
ISI
SICI code
1098-0121(20000115)61:4<2904:PTALKO>2.0.ZU;2-I
Abstract
We have measured the Auger recombination rate for excitons in Cu2O trapped in harmonic potential wells created by inhomogeneous stress. The rate is hi gher than assumed in most previous experiments, but consistent with the rat e reported recently by O'Hara et al. [Phys. Rev. B (to be published)]. We f ind that even given this rate, the orthoexciton density immediately after c reation in the well by a short laser pulse may be high enough for Bose cond ensation, and there is some evidence that this may occur.