Dynamics of surface migration in the weak corrugation regime

Citation
Jv. Barth et al., Dynamics of surface migration in the weak corrugation regime, PHYS REV L, 84(8), 2000, pp. 1732-1735
Citations number
40
Categorie Soggetti
Physics
Journal title
PHYSICAL REVIEW LETTERS
ISSN journal
00319007 → ACNP
Volume
84
Issue
8
Year of publication
2000
Pages
1732 - 1735
Database
ISI
SICI code
0031-9007(20000221)84:8<1732:DOSMIT>2.0.ZU;2-T
Abstract
We report a systematic study for metal-on-metal surface migration in the we ak corrugation regime, i.e., with migration barriers falling below approxim ate to 100 meV. The migration characteristics are elucidated by variable-te mperature scanning tunneling microscopy observations in the 50-200 K temper ature range, which are analyzed by means of nucleation theory. The results demonstrate that, upon entering the weak corrugation regime, the dynamics o f the systems are characterized by increasingly reduced effective preexpone ntial factors, while Arrhenius behavior prevails.