This paper reviews recent progress in the field of GaN/SiC heterojunction b
ipolar transistors. Key issues are identified and discussed. These include
the comparison of a double-mesa and a selectively grown emitter structure,
the evaluation of the GaN/SiC heterojunction and the problems faced when op
erating the devices in a common-emitter mode. A circuit simulation is prese
nted indicating that common-emitter operation can be obtained for devices w
ith low leakage current and modest gain. (C) 2000 Published by Elsevier Sci
ence Ltd. All rights reserved.