Optogalvanic properties of the Ion Guide Source in the recoil nucleus selective photoionization

This consideration is a conjunction of two processes: generation of recoil products and selective detection. A new type of plasma is carried out. The electron energy function distribution of the ion-guide source plasma is cal culated and discussed. The properties of a laser ionization scheme detectin g recoil atoms are analyzed using an optogalvanic approach. The Resonant Laser Ionization (RLI) in low temperature currentless plasma, formed by accelerated particle beam propagating through gas, will be used f or the above mentioned separation. A tuned dye laser excites the studied at oms and the fast electrons ionize them. This process exceeds in cross-secti on the ionization from ground state which provides selectivity of IGS. The latter produces ions of almost all chemical elements. It can be used for in vestigating processes flowing in low temperature currentless plasma which p resents a specific interest. These functions impart to the IGS the role of an Optogalvanic (OG) element, to be precise, of hollow cathode discharge us ed as an OG detector [1]. In this paper the IGS is analyzed as an OG detector in a quasi OG scheme. T he investigation is a step simulating the IGS properties. The Electron Ener gy Distribution Function (EEDF) and the most important processes are analyz ed and discussed as a first step in this field. The results obtained contri bute to the efficiency of the RLI method.