D. Venus et al., Quantitative structural determination using spin-polarized low-energy electron diffraction rotation curves: W(110), SURF SCI, 446(3), 2000, pp. 199-210
Spin-polarized low-energy electron diffraction (LEED) rotation curves measu
red with 30 to 80 eV electrons scattered from a W(110) surface have been an
alysed with calculations using a relativistic multiple scattering theory, w
here quantitative reliability factors (R-factors) have been used to find th
e best fit between theory and experiment. The Zanazzi-Jona ii-factor was us
ed for intensity data, and the mean-squared deviation between theory and ex
periment was used for the spin-polarization data. The variance of the ii-fa
ctors for rotation curves has been derived, and varies as E-1/4 (where E is
the scattering energy). This was used to estimate parameter uncertainties.
The surface layer relaxation of W(110) was found to be -2.2+/-1.0% of the
bulk layer spacing, in agreement with recent current-voltage LEED studies.
These results illustrate that quantitative structural studies using low sca
ttering energies may be performed with spin-polarized LEED rotation curves.
This technique should be well suited to studies of magnetic ultrathin film
s, where magnetic-exchange scattering becomes more predominant at low scatt
ering energies. (C) 2000 Elsevier Science B.V. All rights reserved.