K. Reihs et al., MOLECULAR-WEIGHT DETERMINATION OF BULK POLYMER SURFACES BY STATIC SECONDARY-ION MASS-SPECTROMETRY, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 93-95
The determination of molecular weights at surfaces of bulk polymer mat
erials can be accomplished by static secondary ion mass spectrometry (
SIMS) via fragments originating from repeat units and end groups. The
intensity ratio of these fragments depends on the polymer chain length
as seen for bisphenol-A-polycarbonate and perfluorinated polyethers (
Krytox), A kinetic model of fragment ion formation explains the molecu
lar weight dependent fragment intensities and links them to properties
of the molecular weight distribution. In the most simple case one obt
ains the number average molecular weight <M-n> at the surface. This te
chnique can be used for the determination of the molecular weight at b
ulk polymer surfaces such as a CD-ROM made from polycarbonate by injec
tion molding.