The optimum parameters of a dielectric layer near the substrate in the inte
rference multilayer structure are calculated. The calculations showed that
this layer should have the index of refraction n similar to 3. The results
are presented of measuring the Kerr angle of magnetooptical rotation in the
multilayer structure, in which GeO films were used as dielectric layers fo
r the first time. The maximum Kerr angle of rotation and magnetooptical qua
lity observed in this system were 0.75 degrees and 0.34 degrees, respective
ly. These values exceed those inherent in the known information carriers, w
hich demonstrates the advantage of this structure for use in magnetooptical
discs. (C) 2000 MAIK "Nauka/Interperiodica".