The current-carrying capacity of a wide high-temperature superconducting fi
lm under conditions of rapid injection of current is investigated theoretic
ally. An analytic expression is derived for the rate of current injection i
nto the film at which a marked degradation of the current-carrying capacity
of the film occurs. The obtained results may be important from the standpo
int of analyzing the stability of superconducting ac devices. (C) 2000 MAIK
"Nauka/Interperiodica".