Formation of a highly oriented FeO thin film by phase transition of Fe3O4 and Fe nanocrystallines

Citation
Kj. Kim et al., Formation of a highly oriented FeO thin film by phase transition of Fe3O4 and Fe nanocrystallines, THIN SOL FI, 360(1-2), 2000, pp. 118-121
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
360
Issue
1-2
Year of publication
2000
Pages
118 - 121
Database
ISI
SICI code
0040-6090(20000201)360:1-2<118:FOAHOF>2.0.ZU;2-3
Abstract
A highly oriented FeO thin film was formed from a Fe3O4 thin film containin g Fe nanocrystallines by post-annealing at 600 degrees C. Fe3O4 thin films were grown on Si(100) substrates by ion beam sputter deposition under oxyge n ambient. The stoichiometry of the iron oxide thin film could be precisely controlled by in situ X-ray photoelectron spectroscopy (XPS). X-ray diffra ction (XRD) pattern of the Fe3O4 thin film grown at substrate temperature o f 300 degrees C showed a mixed phase of Fe3O4 and Fe nanocrystallines with a preferred orientation (110). However, the mixed phase was converted to a highly oriented FeO(200) phase by post-annealing at 600 degrees C. This cou ld be inverted as a result of Ostwald ripening of the Fe3O4 and Fe nanocrys tallines. (C) 2000 Published by Elsevier Science S.A. All rights reserved.