Kj. Kim et al., Formation of a highly oriented FeO thin film by phase transition of Fe3O4 and Fe nanocrystallines, THIN SOL FI, 360(1-2), 2000, pp. 118-121
A highly oriented FeO thin film was formed from a Fe3O4 thin film containin
g Fe nanocrystallines by post-annealing at 600 degrees C. Fe3O4 thin films
were grown on Si(100) substrates by ion beam sputter deposition under oxyge
n ambient. The stoichiometry of the iron oxide thin film could be precisely
controlled by in situ X-ray photoelectron spectroscopy (XPS). X-ray diffra
ction (XRD) pattern of the Fe3O4 thin film grown at substrate temperature o
f 300 degrees C showed a mixed phase of Fe3O4 and Fe nanocrystallines with
a preferred orientation (110). However, the mixed phase was converted to a
highly oriented FeO(200) phase by post-annealing at 600 degrees C. This cou
ld be inverted as a result of Ostwald ripening of the Fe3O4 and Fe nanocrys
tallines. (C) 2000 Published by Elsevier Science S.A. All rights reserved.