CHARACTERIZATION OF VAPOR-PHASE DEPOSITED ORGANIC-MOLECULES ON SILICON SURFACES

Authors
DIECKHOFF S HOPER R SCHLETT V GESANG T POSSART W HENNEMANN OD GUNSTER J KEMPTER V
Citation
S. Dieckhoff et al., CHARACTERIZATION OF VAPOR-PHASE DEPOSITED ORGANIC-MOLECULES ON SILICON SURFACES, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 258-262
Citations number
22
Categorie Soggetti
Chemistry Analytical
Journal title
Fresenius' journal of analytical chemistry → ACNP
ISSN journal
09370633
Volume
358
Issue
1-2
Year of publication
1997
Pages
258 - 262
Database
ISI
SICI code
0937-0633(1997)358:1-2<258:COVDOO>2.0.ZU;2-Z
Abstract
Thin films of 2,4,6-tris-(2,2-bisphenyl-propane)- 1,3,5-triazine (p-CP C trimer), deposited on clean, oxidized and H2O-saturated Si(100) surf aces, have been investigated by X-ray Photoelectron Spectroscopy (XPS) , Ultraviolet Photoelectron Spectroscopy (UPS), Metastable Impact Elec tron Spectroscopy (MIES) and Atomic Force Microscopy (AFM). The spectr oscopic results indicate a preferential molecular orientation due to t he interaction of the trioxytriazine rings with the substract surfaces . The study of the surface topography during film formaiton exhibits c haracteristic two dimensional domain patterns caused by a selforganiza tion process.