ATOMIC-RESOLUTION OF DEFECTS IN GRAPHITE STUDIED BY STM

Citation
F. Atamny et al., ATOMIC-RESOLUTION OF DEFECTS IN GRAPHITE STUDIED BY STM, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 344-348
Citations number
19
Categorie Soggetti
Chemistry Analytical
ISSN journal
09370633
Volume
358
Issue
1-2
Year of publication
1997
Pages
344 - 348
Database
ISI
SICI code
0937-0633(1997)358:1-2<344:AODIGS>2.0.ZU;2-5
Abstract
Different kinds of defects in graphite with a resolution up to atomic scale have been investigated using STM. Mono-atomic steps on the surfa ce as well as bended graphite layers with height differences less than 0.1 nm originating from defects (steps) in the bull; have been uncove red. The influence of such defects on the appearance of superstructure s In the surrounding area is demonstrated. Ribbons, with a few nanomet ers width and less than 1 nm height, and prismatic loops were resolved . Height variations in the range of a few tenths of nanometer as a res ult of missed and inserted carbon layers have been revealed. To our kn owledge, for the first time defect lines on graphite are presented wit h an atomic resolution; The defect lints are several microns long and only 1-3 atoms in width.