R. Chakrabarti et al., OPTICAL-PROPERTIES OF DIAMOND FILM DEPOSITED BY CVD OF FREON - STUDIES ON MECHANICAL-PROPERTIES FROM THE ABSORPTION-BAND TAIL, DIAMOND AND RELATED MATERIALS, 6(8), 1997, pp. 991-999
Polycrystalline diamond films were deposited on quartz (fused silica),
glass and Si substrates by chemical vapour deposition of Freon 22 (CH
F2Cl less than or equal to 10 vol%) and hydrogen with substrate temper
ature in the range 525-725 K. Films were sp(3) rich (85-95%) with high
band gap (E-g approximate to 3.7-3.95 eV on glass and E-g approximate
to 4.5-5.5 eV on quartz). The strain and stress in the films were det
ermined from the broadening of the optical absorption edge. The variat
ions of strain and stress on glass with deposition temperature (T-s ap
proximate to 525-725 K) were 5.6-6.0 x 10(-3) and 4.9-5.7 GPa, respect
ively. With variation of freon content (less than or equal to 10 vol%)
in the gas mixture the strain and stress on quartz substrate (for T-s
approximate to 725 K) varied within 1.6-8.0 x 10(-3) and 1.5-7.8 GPa,
respectively. The films were found to be scratch resistant for higher
deposition temperature (T-s greater than or equal to 700 K) and lower
freon content (similar to 1-2 vol%) in the feed gas. The hardness in
the films was observed to decrease from 71 to 63 GPa with increase of
freon content from 2-10 vol%. (C) 1997 Elsevier Science S.A.