Enhanced optical microlithography with a Fabry-Perot-based spatial filtering technique

Citation
M. Erdelyi et al., Enhanced optical microlithography with a Fabry-Perot-based spatial filtering technique, APPL OPTICS, 39(7), 2000, pp. 1121-1129
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
7
Year of publication
2000
Pages
1121 - 1129
Database
ISI
SICI code
0003-6935(20000301)39:7<1121:EOMWAF>2.0.ZU;2-B
Abstract
A coherent multiple imaging technique for use in optical microlithography w as studied. The technique involves placing a thin Fabry-Perot etalon betwee n the mask and the projection lens of an optical stepper. An optical lithog raphic computer simulation tool, Prolith/2, was used to evaluate the aerial image profile obtained for extended mask structures such as typical contac t hole arrays and line-space patterns used in integrated circuit fabricatio n. Additionally,a set of experimental studies were performed to validate th e simulation results. Enhancement of both resolution and depth of focus can be obtained simultaneously with appropriate etalon parameters. (C) 2000 Op tical Society of America.