A coherent multiple imaging technique for use in optical microlithography w
as studied. The technique involves placing a thin Fabry-Perot etalon betwee
n the mask and the projection lens of an optical stepper. An optical lithog
raphic computer simulation tool, Prolith/2, was used to evaluate the aerial
image profile obtained for extended mask structures such as typical contac
t hole arrays and line-space patterns used in integrated circuit fabricatio
n. Additionally,a set of experimental studies were performed to validate th
e simulation results. Enhancement of both resolution and depth of focus can
be obtained simultaneously with appropriate etalon parameters. (C) 2000 Op
tical Society of America.