Submicron-resolution ablation with a KrF excimer laser beam patterned witha projection lens

Citation
F. Weisbuch et al., Submicron-resolution ablation with a KrF excimer laser beam patterned witha projection lens, APPL PHYS A, 69, 1999, pp. S413-S417
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN journal
09478396 → ACNP
Volume
69
Year of publication
1999
Supplement
S
Pages
S413 - S417
Database
ISI
SICI code
0947-8396(199912)69:<S413:SAWAKE>2.0.ZU;2-L
Abstract
A mask projection system working with KrF laser radiation is described. Thi s system produces microscopic laser beams able to pattern gratings on the s urface of various materials in the micrometer range by direct etching. Mode ls have been developed to simulate the beam intensity profile on the sample . Various polymers have been irradiated, and their experimental profiles ar e compared with theoretical ones. Different ablation behaviors have been ev idenced. Interesting consequences of thermal effects at this submicron scal e are reported.