Production of TiN thin films by N-2-laser-ablated Ti atoms in nitrogen gasatmospheres

Citation
R. Castell et al., Production of TiN thin films by N-2-laser-ablated Ti atoms in nitrogen gasatmospheres, APPL PHYS A, 69, 1999, pp. S521-S522
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN journal
09478396 → ACNP
Volume
69
Year of publication
1999
Supplement
S
Pages
S521 - S522
Database
ISI
SICI code
0947-8396(199912)69:<S521:POTTFB>2.0.ZU;2-E
Abstract
Laser ablation has proven to be an important technique for thin film deposi tion because of the high velocity heating and quenching of materials. We ha ve used a nitrogen laser, which is capable of producing nanosecond pulses o f intense UV (337.1 nm) radiation to generate high-temperature and high-ele ctron-density plasmas when strongly focused on titanium targets. Laser beam pulses with a peak energy of 32 J/cm(2) and a power density of 1.6 GW/cm(2 ) were used in this experiment. As ablated Ti species are allowed to expand further in a nitrogen atmosphere, they cool down and eventually dissipate. In this sequence, they meet a substrate where condensation, nucleation, an d growth processes yield TiN thin films because of the reaction with the ni trogen gas. Thin film depositions were made on stainless steel (AISI 1020 a nd AISI 304) substrates at nitrogen gas pressures ranging from 10(-1) Pa to 200 Pa and for different distances between the substrate and the spot wher e the laser beam was focused upon the target. For rather short distances (l ess than 7 mm), optical microscopy shows the effect of a further plasma-thi n film interaction, while at larger distances, the depositions exhibit a re gular film condensation from the vapor. Microstructure characterization of the thin film deposited was done by several techniques. The typical cubic T iN phase was identified by transmission electron microscopy (TEM) and energ y dispersion spectroscopy (EDS).