Structural and transport properties of La0.67Sr0.33Mn1-xSnxO3 thin films

The magnetotransport properties of perovskite manganite films have attracte d much recent interest because of the colossal magnetoresistance (CMR) exhi bited. The La1-xSrxMnO3 mixed valence compound contains Mn3+ with the configuratio n t(2g)(3) e(g)(1) and Mn4+ ions with a t(2g)(3) structure. Doping with Sn could play a role regarding the structural and magnetotransport properties, for tin ions do not have the same interactions as manganese ions. We repor t in this work the structural and transport characteristics of as-deposited and postdeposition annealed La(0.67)Sro(0.33)Mn(1-x)Sn(x)O(3) thin films b y pulsed-laser deposition (PLD). We analyzed the influence of the tin dopin g on film properties. X-ray diffraction (XRD), scanning electron microscopy (SEM), and R vs. T measurements were performed. We found that tin doping p romotes oxygenation of the films, increasing the temperature of electrical transition T rho, and could be an alternative to postannealing treatments.