V. Trtik et al., Influence of laser-ablation plume dynamics on the room-temperature epitaxial growth of CeO2 on silicon, APPL PHYS A, 69, 1999, pp. S815-S818
High-quality epitaxial CeO2 thin films were obtained on Si(001) buffered wi
th a yttria-stabilised zirconia layer by pulsed laser deposition. Although
the best structural properties were achieved at high substrate temperature,
high-quality epitaxy was obtained even at room temperature. Epitaxial grow
th at low temperature is promoted by the high kinetic energy of particles r
eaching the substrate. The oxygen pressure and target-substrate distance ha
d a strong influence on the crystallographic structure and surface morpholo
gy in low-temperature deposition. This behaviour is attributed to a change
in the kinetic energy of the particles, which was evaluated from the plasma
expansion velocity determined by an intensified CCD camera. If a shock wav
e forms, a minimum substrate temperature of 550 degrees C is necessary for
epitaxial growth.