Laser ablation ion-storage time-of-flight mass spectrometry

Citation
Re. Russo et al., Laser ablation ion-storage time-of-flight mass spectrometry, APPL PHYS A, 69, 1999, pp. S895-S897
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
ISSN journal
09478396 → ACNP
Volume
69
Year of publication
1999
Supplement
S
Pages
S895 - S897
Database
ISI
SICI code
0947-8396(199912)69:<S895:LAITMS>2.0.ZU;2-M
Abstract
A new mass spectrometer system was developed for studying laser ablation an d performing analytical chemistry. The system is based on an ion trap geome try used in ion-storage (IS) mode, coupled with a reflectron time-of-flight mass spectrometer (TOFMS). The LA-IS/TOF-MS can be used for MALDI or direc t ionization of samples on a probe tip. The system configuration and relate d operating principles for accurately measuring low concentrations of isoto pes will be described. Preliminary measurements identified ultra-trace cont aminants of Ag, Sn, and Sb in a Pb target with single laser-shot experiment s. Survey analyses of uranyl acetate, hair samples, and mushrooms demonstra ted that this technology can be applied to a wide range of sample materials .