Fine crystal lattice fringes observed using a transmission electron microscope with 1 MeV coherent electron waves

Authors
Kawasaki, T Yoshida, T Matsuda, T Osakabe, N Tonomura, A Matsui, I Kitazawa, K
Citation
T. Kawasaki et al., Fine crystal lattice fringes observed using a transmission electron microscope with 1 MeV coherent electron waves, APPL PHYS L, 76(10), 2000, pp. 1342-1344
Citations number
17
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
76
Issue
10
Year of publication
2000
Pages
1342 - 1344
Database
ISI
SICI code
0003-6951(20000306)76:10<1342:FCLFOU>2.0.ZU;2-#
Abstract
A transmission electron microscope with a 1 MeV cold field-emission electro n source has been developed for coherent and penetrating electron waves. We confirmed the coherence and overall stability of the microscope by observi ng Au(33(7) over bar) lattice fringes. These fringes have a 0.498 Angstrom spacing. (C) 2000 American Institute of Physics. [S0003-6951(00)01110-4].