Attenuated total internal reflection infrared mapping microspectroscopy ofsoft materials

Attepuated total internal reflection (ATR) infrared mapping microspectrosco py of soft samples is reviewed and investigated by using cartridge-based ge rmanium hemispheres. The study demonstrates the use of these devices for ob taining line scans or maps of soft pliable surfaces over an area of approxi mately 100 x 100 micrometers. An experimental determination of the spatial resolution by using a cross-sectioned polymer film showed a twofold improve ment over transmission infrared microspectroscopy for sample sizes at the d iffraction limit. Optical details of the devices are discussed in the conte xt of ATR measurements in addition to their application for the study of po lymer laminates often encountered in industry and forensics.