G. Zimmermann et al., THE ROLE OF N-2 AND H-2 AS CARRIER GAS ON THE SELECTIVE-AREA MOVPE OFINP-BASED HETEROSTRUCTURES USING TBAS AND TBP AS GROUP-V SOURCES, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 37-40
Hydrogen and nitrogen have been employed as carrier gases for the sele
ctive growth of InP-based materials on patterned substrates using tert
iarybutyl-arsine (TBAs) and -phosphine (TBP) as alternative group-V so
urces at different reactor pressures. The properties of the deposited
layers have been found to be mainly determined by the diffusion coeffi
cient in the vapour phase, which increases by reducing the reactor pre
ssure or using H-2 instead of N-2. A higher edge growth, combined with
a smaller zone of enhanced growth and, where appropriate, In-enrichme
nt near the masks was detected at atmospheric pressure deposition and
for the use of N-2, respectively. Furthermore a higher selectivity has
been observed for both carriers at reduced reactor pressures and when
using H-2 instead of N-2. Nitrogen as carrier gas offers an additiona
l independent parameter to control the properties of selectively depos
ited layers and reduces the safety risks of the MOVPE process especial
ly when being combined with less toxic group-V sources. (C) 1997 Publi
shed by Elsevier Science S.A.