OPTICAL AND STRUCTURAL-PROPERTIES OF ANODIZED ALXGA1-XAS LAYERS

Authors
XIANG XB LIAO XB CHANG SL DU WH
Citation
Xb. Xiang et al., OPTICAL AND STRUCTURAL-PROPERTIES OF ANODIZED ALXGA1-XAS LAYERS, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 121-124
Citations number
3
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Materials science & engineering. B, Solid-state materials for advanced technology → ACNP
ISSN journal
09215107
Volume
44
Issue
1-3
Year of publication
1997
Pages
121 - 124
Database
ISI
SICI code
0921-5107(1997)44:1-3<121:OASOAA>2.0.ZU;2-T
Abstract
The optical and structural properties of anodized AlxGa1-xAs films wer e investigated by using optical reflectance, X-ray photoemission and A uger electron spectroscopy (XPS and AES). II was found that the anodiz ation process occurs progressively from the surface to the bulk of Alx Ga1-xAs and the formed oxidation film comprises mainly oxides of Al an d Ga together with a relatively small amount of As. The refractive ind exes of the anodized Al0.8Ga0.2As film and Al0.8Ga0.2As film itself we re deduced to be about 1.80 and 3.25, respectively, indicating that th e anodization film is desirable for anti-reflection coating of the sur face of AlxGa1-xAs/GaAs solar cells. (C) 1997 Elsevier Science S.A.