M. Missous, FUNDAMENTAL ISSUES OF DEVICE-RELEVANT LOW-TEMPERATURE GAAS AND RELATED MATERIALS PROPERTIES, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 304-310
In the past few years, a flurry of activity has been devoted to the st
udies and device applications of non-stoichiometric GaAs grown by mole
cular beam epitaxy at the extremely low temperature (LT) of 250 degree
s C or below using, in essence, identical growth conditions to those o
f 'normal'. high temperature (> 500 degrees C) grown materials. These
materials are highly non-stoichiometric, containing a massive amount o
f excess As in the lattice which totally dominates the electro-optical
characteristics. This essentially defect-controlled material, in both
its as-grown state and after annealing, leads thereafter to a number
of device concepts and applications ranging from buffer layers to fast
photoconductors. In this study, a detailed investigation of the growt
h conditions, including growth dynamics, has established that the non-
stoichiometry of LT GaAs is not an intrinsic property but a perfectly
controllable one. We report here on new phenomena associated with the
growth of GaAs and related compounds at less than or equal to 250 degr
ees C and present data on highly electrically and optically active mat
erial demonstrating electro-optical qualities comparable to those grow
n at high temperatures, as evidenced by photoluminescence (PL) of quan
tum wells and sheet densities and mobilities in HEMT structures. It is
therefore surmised that non-stoichiometry in low-temperature-grown Ga
As can be overcome, leading to the growth of stoichiometric low temper
ature (SLT) materials possessing properties similar to those of conven
tional, high-temperature-grown layers. (C) 1997 Elsevier Science S.A.