DETERMINATION OF AUGER-SENSITIVITY-FACTORS IN ZN1-XMGXTE FOR QUANTITATIVE SURFACE-ANALYSIS

Authors
WIRTHL E SITTER H BAUER P
Citation
E. Wirthl et al., DETERMINATION OF AUGER-SENSITIVITY-FACTORS IN ZN1-XMGXTE FOR QUANTITATIVE SURFACE-ANALYSIS, Materials science & engineering. B, Solid-state materials for advanced technology, 44(1-3), 1997, pp. 400-402
Citations number
13
Categorie Soggetti
Material Science","Physics, Condensed Matter
Journal title
Materials science & engineering. B, Solid-state materials for advanced technology → ACNP
ISSN journal
09215107
Volume
44
Issue
1-3
Year of publication
1997
Pages
400 - 402
Database
ISI
SICI code
0921-5107(1997)44:1-3<400:DOAIZF>2.0.ZU;2-Z
Abstract
We investigated the ternary II-VI compound semiconductor Zn1-xMgxTe, w here the range of x was between 0 (in the case of pure ZnTe) and 1 (in the case of pure MgTe). Emphasis was put on the behaviour of the sens itivity factor a of the various elements as a function of x. These sen sitivity factors were calculated using a new theoretical approach. We found a strong dependence of the sensitivity factors on the compound c omposition. In the case of Te we also observed a change in the line sh ape in the Auger spectrum and the appearance of Coster-Kronig transiti ons. (C) 1997 Elsevier Science S.A.