There exist measuring devices where an analog input is converted into a dig
ital output. Such converters can have a nonlinear internal dynamics. We sho
w how measurements with such converting devices can be understood using con
cepts from symbolic dynamics. Our approach is based on a nonlinear one-to-o
ne mapping between the analog input and the digital output of the device. W
e analyze the Bernoulli shift and the lent map which are realized in specif
ic analog/digital (A/D) converters. Furthermore, we discuss the sources of
errors that are inevitable in physical realizations of such systems and sug
gest methods for error reduction. (C) 2000 Elsevier Science Ltd. All rights
reserved.