Nanoscale chemical analysis by tip-enhanced Raman spectroscopy

Citation
Rm. Stockle et al., Nanoscale chemical analysis by tip-enhanced Raman spectroscopy, CHEM P LETT, 318(1-3), 2000, pp. 131-136
Citations number
16
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CHEMICAL PHYSICS LETTERS
ISSN journal
00092614 → ACNP
Volume
318
Issue
1-3
Year of publication
2000
Pages
131 - 136
Database
ISI
SICI code
0009-2614(20000218)318:1-3<131:NCABTR>2.0.ZU;2-R
Abstract
A fine metal tip brought to within a few nanometers of a molecular film is found to give strong enhancement of Raman scattered light from the sample. This new principle can be used for molecular analysis with excellent spatia l resolution, only limited by the tip apex size and shape. No special sampl e preparation is required, and the enhancement is identical at every sample location, allowing for quantitative surface-enhanced Raman spectroscopy me asurements. When scanning the tip over the sample surface. topographic info rmation is obtained simultaneously and can be directly correlated with the spectroscopic data. (C) 2000 Elsevier Science B.V. All rights reserved.