A fine metal tip brought to within a few nanometers of a molecular film is
found to give strong enhancement of Raman scattered light from the sample.
This new principle can be used for molecular analysis with excellent spatia
l resolution, only limited by the tip apex size and shape. No special sampl
e preparation is required, and the enhancement is identical at every sample
location, allowing for quantitative surface-enhanced Raman spectroscopy me
asurements. When scanning the tip over the sample surface. topographic info
rmation is obtained simultaneously and can be directly correlated with the
spectroscopic data. (C) 2000 Elsevier Science B.V. All rights reserved.