The capacitance vs. voltage characteristics and the current vs. voltage cha
racteristics of the thin film solar cell consisting of a transparent conduc
tive oxide/CdS/CuInS2 heterostructure are analyzed in terms of the theoreti
cal device model where a very thin n-type CuInS2 layer exists on the top su
rface of the p-type absorber layer. The CuInS2 absorber layer is prepared b
y sulfurization of precursors deposited on a Mo-coated soda lime glass subs
trate or a Pt foil substrate. When the absorber layer is prepared on the fo
rmer the heterostructure is an abrupt junction in which the net acceptor co
ncentration of the absorber layer is of the order of 10(16)-10(17) cm(-3),
but when prepared on the latter it is a linearly graded junction in which t
he gradient of the acceptor concentration lying in the order of 10(20)-10(2
1) cm(-4) is a decreasing function of precursor thickness. The highest open
circuit voltage of 0.755 V is obtained in a solar cell that consists of th
e thickest absorber layer prepared on the latter and hence exhibits the low
est built-in electric field at the junction interface.