XPS studies of radiation grafted PTFE-g-polystyrene sulfonic acid membranes

Citation
Mm. Nasef et al., XPS studies of radiation grafted PTFE-g-polystyrene sulfonic acid membranes, J APPL POLY, 76(3), 2000, pp. 336-349
Citations number
24
Categorie Soggetti
Organic Chemistry/Polymer Science","Material Science & Engineering
Journal title
JOURNAL OF APPLIED POLYMER SCIENCE
ISSN journal
00218995 → ACNP
Volume
76
Issue
3
Year of publication
2000
Pages
336 - 349
Database
ISI
SICI code
0021-8995(20000418)76:3<336:XSORGP>2.0.ZU;2-2
Abstract
Structural investigations of PTFE-g-polystyrene sulfonic acid membranes pre pared by radiation grafting of styrene onto PTFE were conducted by X-ray ph otoelectron spectroscopy (XPS). The analyzed materials included original PT FE film as a reference material, grafted film, and sulfonated membrane samp les having various degrees of grafting. Interest is focused on C1s, F1s, O1 s, and S2p of narrow XPS spectra as the basic elemental components of the m embrane, The original PTFE film was found to undergo structural changes in terms of chemical composition and shifting in binding energy induced by inc orporation of sulfonated polystyrene grafts, and the amount of such changes depends on the degree of grafting. The atomic ratio of F/C was found to de crease with the increase in the degree of grafting, while that for S/C and O/C were found to increase. (C) 2000 John Wiley & Sons, Inc.