MBE growth of high-quality ZnO films on epi-GaN

Citation
Hj. Ko et al., MBE growth of high-quality ZnO films on epi-GaN, J CRYST GR, 209(4), 2000, pp. 816-821
Citations number
10
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
209
Issue
4
Year of publication
2000
Pages
816 - 821
Database
ISI
SICI code
0022-0248(200002)209:4<816:MGOHZF>2.0.ZU;2-J
Abstract
High-quality ZnO films have been grown on epi-GaN predeposited on Al2O3 sub strates using RF-plasma assisted molecular beam epitaxy. The growth conditi ons to obtain high-quality ZnO films on epi-GaN are Zn-pre-growth treatment on epi-GaN and two-step growth. RHEED intensity oscillations are observed from the beginning of ZnO growth on the low-temperature ZnO buffer layer in dicative of two-dimensional growth. Low-temperature (10 K) photoluminescenc e of ZnO films grown on epi-GaN shows that the linewidth of the strongest e mission at 3.3676 eV is as narrow as 1.5 meV, while the deep-level emission at around 2.3 eV is negligibly small. (C) 2000 Elsevier Science B.V. All r ights reserved.