Atomic force microscopy studies on the surface morphology of {111} tabularAgBr crystals

Citation
M. Plomp et al., Atomic force microscopy studies on the surface morphology of {111} tabularAgBr crystals, J CRYST GR, 209(4), 2000, pp. 911-923
Citations number
29
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CRYSTAL GROWTH
ISSN journal
00220248 → ACNP
Volume
209
Issue
4
Year of publication
2000
Pages
911 - 923
Database
ISI
SICI code
0022-0248(200002)209:4<911:AFMSOT>2.0.ZU;2-D
Abstract
Both ex situ and in situ atomic force microscopy have been applied to study the (1 1 1) and (1 0 0) surfaces of tabular silver bromide crystals grown from dimethyl sulphoxide-water solutions. This resulted in observations of monosteps, macrosteps, etch pits, pinning of steps and nucleated crystals s howing twin planes. These examinations indicate that the growth and dissolu tion of both the (1 0 0) and the polar (1 1 1) faces occur via steps in man y configurations. The registered 40-nm distance between the parallel twin p lanes of the nucleated crystals agrees with transmission electron microscop y measurements done on tabular crystals grown by the industrial double-jet precipitation method. (C) 2000 Elsevier Science B.V. All rights reserved.