Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates

Authors
Branger, V Coupeau, C Goudeau, P Boubeker, B Badawi, KF Grilhe, J
Citation
V. Branger et al., Atomic force microscopy analysis of buckling phenomena in metallic thin films on substrates, J MAT SCI L, 19(4), 2000, pp. 353-355
Citations number
16
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
JOURNAL OF MATERIALS SCIENCE LETTERS
ISSN journal
02618028 → ACNP
Volume
19
Issue
4
Year of publication
2000
Pages
353 - 355
Database
ISI
SICI code
0261-8028(200002)19:4<353:AFMAOB>2.0.ZU;2-P