A method is described whereby a sequence of X-ray images at closely spaced
photon energies is acquired using a Scanning transmission X-ray microscope,
and aligned. Near-edge absorption spectra can then be obtained both from l
arge, irregular regions, and from regions as small as the spatial resolutio
n of the microscope (about 40 nm in the examples shown here), The use of th
e technique is illustrated in examination of a layered polymer film, a micr
ometeorite section, and an interplanetary dust particle section.