Resonant Raman scattering in Nd2O3 and the electronic structure of Sr2RuO4Studied by synchrotron radiation excitation

This paper is intended to illustrate two points. The first is the extensive growth of resonant Raman soft X-ray scattering due to the emergence of thi rd-generation X-ray sources, With these sources, the ubiquitous presence of Raman scattering near the 3d and 4d ionization thresholds has been used to elucidate the excitation process in a number of rare earth and transition metal compounds. Such scattering can produce dramatic changes in the emissi on spectrum, as we show in our example of inelastic scattering at the 3d th reshold of Nd2O3 Photon-in photon-out soft X-ray spectroscopy is adding a n ew dimension to soft X-ray spectroscopy by providing many opportunities for exciting research, especially at third-generation synchrotron light source s, Second, it is very effective to use theory and experiment to characteriz e the electronic properties of materials. In particular we confirmed in-pla ne oxygen-ruthenium bonding in Sr2RuO4, the first copperless perovskite sup erconductor, by analyses using calculations, soft X-ray emission spectrosco py (SXE) and photoelectron spectroscopy (PES). Measurements of this type il lustrate the importance of combining SXE and PES measurements with theoreti cal calculations. (C) 2000 Published by Elsevier Science Ltd. All rights re served.