The Large Angle Convergent Beam Electron Diffraction (LACBED) technique has
been applied to determination of the tetragonal mismatch in coherent Si/Si
1-xGex/Si heterostructures. Two-dimensional (2D) dynamical simulation of th
e LACBED patterns has been performed and compared with the corresponding ex
perimental ones. A good agreement is found in the whole simulated area, par
ticularly as regards the splining of the Bragg contours, due to the strain
field present in the TEM cross-sections. (C) 2000 Elsevier Science Ltd. All
rights reserved.