Optically detected cyclotron resonance investigations on 4H and 6H SiC: Band-structure and transport properties

Citation
Bk. Meyer et al., Optically detected cyclotron resonance investigations on 4H and 6H SiC: Band-structure and transport properties, PHYS REV B, 61(7), 2000, pp. 4844-4849
Citations number
26
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
10980121 → ACNP
Volume
61
Issue
7
Year of publication
2000
Pages
4844 - 4849
Database
ISI
SICI code
1098-0121(20000215)61:7<4844:ODCRIO>2.0.ZU;2-M
Abstract
We present experimental data on the band-structure and high-mobility transp ort properties of 6H and 4H-SiC epitaxial films based on optically detected cyclotron resonance investigations. From the orientational dependence of t he electron effective mass in 6H-SiC we obtain direct evidence for the came ls back nature of the conduction band between the M and L points. The broad ening of the resonance signal in 4H-SIC as a function of temperature is use d to extract information on electron mobilities and to conclude on the role of the different scattering mechanisms. Under high microwave powers an enh ancement of the electron effective mass is found which is explained by a co upling of the electrons with longitudinal optical phonons.