Scanning tunneling microscopy of chromium-filled carbon nanotubes: Tip effects and related topographic features

Authors
Zha, FX Czerw, R Carroll, DL Kohler-Redlich, P Wei, BQ Loiseau, A Roth, S
Citation
Fx. Zha et al., Scanning tunneling microscopy of chromium-filled carbon nanotubes: Tip effects and related topographic features, PHYS REV B, 61(7), 2000, pp. 4884-4889
Citations number
18
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
PHYSICAL REVIEW B
ISSN journal
10980121 → ACNP
Volume
61
Issue
7
Year of publication
2000
Pages
4884 - 4889
Database
ISI
SICI code
1098-0121(20000215)61:7<4884:STMOCC>2.0.ZU;2-#
Abstract
We have used ultrahigh vacuum scanning tunneling microscopy (STM) to study chromium (Cr)-filled carbon nanotubes, STM micrographs show filled tubes to be less than 1 nm in height, while transmission electron microscopy indica tes that Cr-filled naotubes are multiwalled with diameters generally over 1 0 nm. In this paper, we demonstrate that the small apparent heights are due to the STM tip status, which also accounts for the topographic anomalies o bserved.