Stress and displacement distributions on the surface of a piezoelectric wafer

Citation
Vn. Danilov et In. Ermolov, Stress and displacement distributions on the surface of a piezoelectric wafer, RUSS J NOND, 35(9), 1999, pp. 669-674
Citations number
10
Categorie Soggetti
Material Science & Engineering
Journal title
RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING
ISSN journal
10618309 → ACNP
Volume
35
Issue
9
Year of publication
1999
Pages
669 - 674
Database
ISI
SICI code
1061-8309(199909)35:9<669:SADDOT>2.0.ZU;2-L
Abstract
A computer model is sued to calculate the distributions of stresses and dis placements (deformations) on the piezoelectric-wafer surface facing the tes ted object during radiation and reception.