Surface potential mapping: comparison of the vibrating capacitor and the SPV method

Authors
Citation
J. Mizsei, Surface potential mapping: comparison of the vibrating capacitor and the SPV method, SOL ST ELEC, 44(3), 2000, pp. 509-513
Citations number
6
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Eletrical & Eletronics Engineeing
Journal title
SOLID-STATE ELECTRONICS
ISSN journal
00381101 → ACNP
Volume
44
Issue
3
Year of publication
2000
Pages
509 - 513
Database
ISI
SICI code
0038-1101(200003)44:3<509:SPMCOT>2.0.ZU;2-D
Abstract
Surface potential maps are very important for characterisation of insulator covered and bare semiconductor surfaces. Contactless methods use capacitiv e coupling. Vibration (vibrating capacitor) and light (SPV, surface photo v oltage method) are used for the surface excitation. Both methods give infor mation about the surface potential, and are sensitive to the surface charge , too. This article discusses the differences and similarities between the methods, concerning theory, application and evaluation of the results. Seve ral surface potential maps an presented and evaluated too. (C) 2000 Elsevie r Science Ltd. All rights reserved.