Critical current density of thin YBCO films on buffered sapphire substrates

Authors
Komashko, VA Popov, AG Svetchnikov, VL Pronin, AV Melnikov, VS Galkin, AY Pan, VM Snead, CL Suenaga, M
Citation
Va. Komashko et al., Critical current density of thin YBCO films on buffered sapphire substrates, SUPERCOND S, 13(2), 2000, pp. 209-214
Citations number
21
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SUPERCONDUCTOR SCIENCE & TECHNOLOGY
ISSN journal
09532048 → ACNP
Volume
13
Issue
2
Year of publication
2000
Pages
209 - 214
Database
ISI
SICI code
0953-2048(200002)13:2<209:CCDOTY>2.0.ZU;2-3
Abstract
The critical current density of YBa2Cu3O7-delta films de magnetron sputtere d onto buffered (CeO2) sapphire substrates is measured. The peculiarities o f these dependences are interpreted by taking into account the crystal defe ct (edge dislocations) film structure which in turn is determined by the fi lm growth mode.